esponse-surface-methodology

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ADA-Yamam / -Yield-Optimization-of-TSMC-28nm-Virtual-Fab-Using-Sequential-RSM-and-Six-Sigma-in-JMP-

Virtual 9-stage TSMC 28nm fab simulation in JMP using sequential RSM and Six Sigma (DMAIC). Achieved >90% yield, tracked cascading defects, and optimized Cpk from 0.94 to 3.84.

six-sigma jmp process-capability yield-optimization cascading-defects esponse-surface-methodology

Updated May 26, 2026

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